Products

CA20

Compact and versatile solution from 2D and 3D microfocal inspection for semicon, advanced packaging and science and research.

FF35 CT

A top-class CT with an extraordinary variability.

XS Series

The XS-platform series is a small-footprint high-resolution automated X-ray inspection system concept.

Related categories

3D measurement for semicon applications

Koh Young offers a full range of inspection machines for semicon applications. Based on the standard platform the Meister S, Meister D and Meister...

Semiconductor testing products

FEINMETALL today has a leading position in the technology of probe cards for contacting semiconductors. The producst are also know as Probe...